Pdf.com is a leading provider of process-design integration
Title
PDF Solutions, Inc., the leading provider of Process-Design Integration.
Description
PDF Solutions, Inc. (Nasdaq: PDFS) is a leading provider of Process-Design Integration technologies for integrated circuits (ICs). PDF's software, methodologies and services enable semiconductor companies to create more manufacturable IC designs and more capable manufacturing processes. Headquartered in San Jose, California, PDF operates worldwide with additional offices in Europe and Japan.
PDF's innovative Process-Design Integration technologies and services enable leading semiconductor companies to increase the yield and performance of deep sub-micron integrated circuits (ICs). By simulating the statistical interactions of IC product design and manufacturing process, our proven solutions offer clients reduced time to market, increased IC yield and performance, and enhanced product reliability and profitability.
Our solutions combine proprietary process and design simulation with analysis software, comprehensive Characterization Vehicle™ test chips, proven yield and performance enhancement methodologies, and consulting services. Using these capabilities, we predict and help improve manufacturing results before product ramp begins.
Languages
English
Address
- 333 W. San Carlos St. Ste 700, 700
- San Jose CA 95110 US
Contact
- PDF Solutions, Inc.
-
- +1 408 280 7900, Fax: +1 408 280 7915
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Additional Information
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- Analysis Of Variance Anova
- Batch Manager
- Best Case
- Bin Map
- Bit Map
- Boxplot
- Cv
- Capability Analysis Cp
- Characterization Reports
- Characterization Vehicle
- Circuit Surfer
- Classification Trees Cte
- Commonality
- Contacts
- Correlation Analysis
- Cp K And Cpk N
- Cumulative Probability
- Data Power
- Data Power Fabless
- Data Mining
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- Defect Map
- Delta Calculation Report
- Dp Web
- Factorial Anova
- Histogram
- Integrated Database
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- Lots Tested Report
- Mapping Tools
- Max Incidence Summary
- Measurement System Comparison Msc
- Min
- Multiple Histograms
- Multiple Linear Regression
- Nested Anova
- Pcm Summary Report
- Pareto Analysis
- Pattern Robustness
- Process Capibility Study
- Product Sensitivity Analysis Psa
- Regression
- Reject Oriented Analysis Roa
- Report Manager
- Reporting Tools
- Scatter Plot
- Shmoo Plot
- Simple Anova
- Single Histogram
- Tool To Tool
- Trend Chart
- Wafer Map
- Worst Case Analysis
- Yield Optimizer
- Yield Analysis
- Yield Report
- Yield Summary Report
- Zonal Report
- Analysis Of Variance ANOVA
- BatchMANAGER
- BinMAP
- BitMAP
- CV
- Classification Trees CTE
- CpK And CpkN
- DataPOWER
- DataPOWER Fabless
- DefectMAP
- DpWEB
- Factorial ANOVA
- Measurement System Comparison MSC
- Nested ANOVA
- PCM Summary Report
- PatternROBUSTNESS
- Product Sensitivity Analysis PSA
- Reject Oriented Analysis ROA
- ReportMANAGER
- ShmooPLOT
- Simple ANOVA
- Temperature Characterization Report
- Tool-to-Tool
- WaferMAP
- YieldOPTIMIZER